42.0062 – Multi Contact

The MULTI CONTACT 42.0062 is a spring-loaded test probe, commonly used for temporary electrical connection in automated test equipment (ATE) and in-circuit testing (ICT) applications. Constructed with a gold-plated plunger and barrel to ensure low contact resistance and high signal integrity, the 42.0062 features a defined spring force, optimized for reliable contact with target pads or components. The probe’s design incorporates a precision-machined tip, available in various point styles (conical, crown, or flat), to accommodate different contact geometries and materials. The barrel is designed for press-fit installation into a receptacle, facilitating easy replacement and maintenance. Electrical specifications, contingent on tip style and applied force, typically include a current rating of 3A and a contact resistance of less than 50 mΩ. The probe’s mechanical life is rated for a minimum of 1 million cycles, ensuring long-term reliability in high-volume testing environments.